Real-Time Statistical Accumulation

With Total Vu software’s Advanced SPC option, you can accumulate statistics on selected measurements in real time.

A sampling plan defines when measurements will be sampled for SPC and the size and frequency of subgroups. Statistical subsets may also be defined to correspond to intervals such as a spool or box of product. Reports may be generated on the entire batch, per spool/package, or both. You can automatically calculate process control limits after a specified number of subgroups. There is no limit to the number of sampling plans that may be defined.

Statistics include: Sample Count, Maximum, Minimum, Difference, Average, Standard Deviation, Coefficient of Variation (CV), CV %, Cp, CpK, CR, Pp and PpK. Subgroup Statistics include: Maximum, Minimum, Range, Average and Range-bar.

Users can create histogram and X-bar/Range charts for real-time display, solely for reporting, or both. With no limit to the number of charts, you can graph as many variables as needed. The histogram can be configured to show specification limits, control limits, a normal curve, + and - three standard deviations from average, average, and frequencies. The X-bar/range chart is offered in several styles: combination, separate X-bar and range graphs on the same window, just x-bar, or just range.

Advanced SPC also includes user-designed reports based on Microsoft Excel templates.

Total Vu software options: Customizable Reports, FFT-SRL, Lobex™ Lobing Detection System, Multi-Strand, OPC, Other Options.

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